Many developments laid the groundwork of the electron optics used in microscopes. See also: Transmission electron microscopy § History Reproduction of an early electron microscope constructed by Ernst Ruska This articles contains some general information mainly about transmission electron microscopes. Photoemission electron microscopy (PEEM) which is similar to LEEM using electrons emitted from surfaces by photonsĪdditional details can be found in the above links.Low-energy electron microscopy (LEEM), used to image surfaces.Ultrafast scanning electron microscopy, version of a SEM that can operate very fast.Electron microprobe similar to a SEM, but more for chemical analysis.Scanning electron microscope (SEM) which is similar to STEM, but with thick samples.Scanning transmission electron microscopy (STEM) which is similar to TEM with a scanned electron probe.Transmission electron microscopy (TEM) where swift electrons go through a thin sample.As the wavelength of an electron can be up to 100,000 times smaller than that of visible light, electron microscopes have a much higher resolution of about 0.1 nm, which compares to about 200 nm for light microscopes. They use electron optics that are analogous to the glass lenses of an optical light microscope to control the electron beam, for instance focusing them to produce magnified images or electron diffraction patterns. JSTOR ( September 2023) ( Learn how and when to remove this template message)Īn electron microscope is a microscope that uses a beam of electrons as a source of illumination.Unsourced material may be challenged and removed.įind sources: "Electron microscope" – news Please help improve this article by adding citations to reliable sources. This article needs additional citations for verification.
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